X-ray Photoelectron Spectroscopy (XPS)

• Basic Principles
• Parallel Imaging
• Ar Cluster Source Depth Profiling
• Applications in Materials Science
• Latest Instrument Developments
• Complementary surface analysis techniques

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Free XPS WorkshopKarlsruhe Institute of Technology (KIT, Campus North) Hermann-von- Helmholtz-Platz 1 76344 Eggenstein-Leopoldshafen Germany 25th and 26th of June 09.00 – 17.00 27th of June 09.00 – 12.30

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