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Peeling Back the Layers – Characterizing Multi-layer Structures using FT-IR and Raman Microscopy 16.07.2014

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Peeling Back the Layers – Characterizing Multi-layer Structures using FT-IR and Raman Microscopy 16.07.2014

On July 15, 2014, Posted by , In Webinarii, With No Comments

Topics include:

  • Benefits of micro-spectroscopy
  • Using software  to help in multilayer analysis (wizards)
  • Imaging ATR and how can it help with your detective work

More info here:

Webinar’Characterizing Multi-layer Structures using FT-IR and Raman Microscopy – Register today!Webinar 2: July 16, 2014 Peeling Back the Layers – Characterizing Multi-layer Structures using FT-IR and Raman Microscopy. Register Today.

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