Presenting the multi-technique toolkit for an XPS system
Tuesday, November 17, 2020
EMEA: 12 p.m. GMT, 1 p.m. CET, 5:30 p.m. IST
North America: 9 a.m. PDT, 11 a.m. CDT, 12 p.m. EDT
In our upcoming webinar, we will present how the additional analytical methods available on our Thermo Scientific™ Nexsa™ Surface Analysis System and our Thermo Scientific ESCALAB™ Xi+ XPS Microprobe can build on XPS data to provide comprehensive analysis. ISS, UPS, REELS, AES, and Raman spectroscopy will be introduced and explained in the webinar, and examples will be shown to highlight the best combinations of this comprehensive toolset for specific applications.
Attend this webinar to learn:
•Basics of ion scattering spectroscopy (ISS), reflected electron energy loss spectroscopy (REELS), UV photoelectron spectroscopy (UPS), Auger electron spectroscopy
•Extra information that these techniques can provide to complement XPS
•Example analyses to illustrate which combinations are suitable for particular sample types
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