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PS Simplified: The Basics of XPS 2 – From the sample to photoelectrons to spectra to results 11.03.2015

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PS Simplified: The Basics of XPS 2 – From the sample to photoelectrons to spectra to results 11.03.2015

On February 27, 2015, Posted by , In Webinarii, With No Comments

In the next presentation of our XPS Simplified Webinar Series, we will look at the analysis of a single sample to show:

  • A step-by-step guide to a routine XPS analysis.
  • Explain how is XPS data interpreted?
  • Show how quantified chemical composition information is obtained?
  • Demonstrate how XPS images and depth profiles are generated?
  • Describe what help is available to the surface analyst?

More information and registration here:

From sample to photoelectrons to results: More XPS BasicsX-ray photoelectron spectroscopy (XPS) is a widely-used technique for quantifying the surface chemistry of materials; providing information from the outer-most few nanometres of a samples surface. In our first webinar of 2015 we introduced the basics of XPS (available on demand here), describing the theory, physics, and experimental requirements of the technique.

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