Introducing the K-Alpha+ XPS Spectrometer 22.7.2014

On July 15, 2014, Posted by , In Webinarii, By ,,, , With No Comments

In this webinar, we introduce the latest advances in XPS technology that further extend the capabilities of the K-Alpha spectrometer. Using real-world examples, we demonstrate how the features of the new K-Alpha+ make surface analysis more efficient, more productive, and applicable to even larger applications and new materials. More info…