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Webinar: XPS Depth Profiling 20.05.2015

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Webinar: XPS Depth Profiling 20.05.2015

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Outside of large area point analysis, depth profiling is probably one of the most common experiments performed with an XPS instrument. In the next presentation of our XPS Simplified Webinar Series, we:

  • Introduce XPS depth profiling
  • Describe what is needed for an XPS depth profile experiment
  • Discuss experimental considerations
  • Show how to process depth profile data, illustrated with real-world case studies
  • Describe new innovations, such as how the introduction of gas cluster ion sources has expanded the use of depth profiling

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